Center for Electron Microscopy and Microanalysis
In Association with:

JSM 7001F Field Emission Scanning Electron Microscope

Images or Results

The JSM-7001F-LV is an analytical field emission scanning electron microscope equipped with imaging detectors for secondary and backscattered electrons it has analytical detectors for electron backscatter diffraction (EBSD) and energy dispersive X-ray spectrometer (EDS). The low vacuum mode can be used for imaging of untreated non-conductive specimens.

Room No :
CEM 106D

Primary Contact :
John Curulli
curulli at
(213) 740-1990

Secondary Contact :
Sebastian Riano Zambrano
rianozam at usc dot edu

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