Center for Electron Microscopy and Microanalysis
In Association with:

Multbeam JIB 4500 Multibeam Focused Ion Beam

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The JIB-4500 is a high performance LaB6 SEM with Ga liquid metal ion source FIB. It is equipped with EDAX energy dispersive X-ray spectrometer (EDS) and Omniprobe AutoProbe 200 in situ TEM lift-out and Omniprobe OmniGIS gas injector system..

Room No :
CEM 106E

Primary Contact :
John Curulli
(213) 740-1990

Secondary Contact :
Sebastian Riano Zambrano
rianozam at usc dot edu

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