Center for Electron Microscopy and Microanalysis
In Association with:

Nova NanoSEM 450 Field Emission Scanning Electron Microscope

Images or Results

Field emission SEM with ultra-stable, high current Schottky gun, Advanced optics and detection, including an immersion mode, beam deceleration, in-lens TLD-SE and -BSE, DBS and STEM for best selection of the information and image optimization

Room No :
CEM 106C

Primary Contact :
John Curulli
curulli at
(213) 740-1990

Secondary Contact :

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