Center for Electron Microscopy and Microanalysis
In Association with:

Nova NanoSEM 450 Field Emission Scanning Electron Microscope

Images or Results




Field emission SEM with ultra-stable, high current Schottky gun, Advanced optics and detection, including an immersion mode, beam deceleration, in-lens TLD-SE and -BSE, DBS and STEM for best selection of the information and image optimization


Room No :
CEM 106C

Primary Contact :
John Curulli
curulli at usc.edu
(213) 740-1990

Secondary Contact :





Home | Mission Statement | Instruments | Professional Staff | Advisery Committee | Rules | Visit Us | Career